Micro-Milling of Test Samples Using A Focused Ion Beam

The focused ion beam and omniprobe micro-manipulator can be used to micro-mill test samples and manipulate them for investigation of fracture mechanisms in nano-structured materials. Three sequential images of micro cantilevers are shown for a filled and unfilled polymer system. The reinforced polymer system shows increased tortuosity of the crack path and microcracking and crack pinning are present in the system.